SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Infrared Materials, Devices, and Applications - Analysis of thermal stress damage in single-crystal silicon induced by 1064nm long pulse laser

✍ Scribed by Chen, Yanbei; Lu, Jian; Ni, Xiaowu; Cai, Yi; Gong, Haimei; Chatard, Jean-Pierre

• Book ID: 121216144
• Publisher: SPIE
• Year: 2007
• Weight: 289 KB
• Volume: 6835
• Category: Article
• DOI: 10.1117/12.757773