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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Sensor Systems and Applications - System for measuring temperature and strain separately by BOTDR and OTDR

✍ Scribed by Sakairi, Yoshiyuki; Uchiyama, Haruyoshi; Li, Zhi Xien; Adachi, Shoji; Rao, Yun-Jiang; Jones, Julian D. C.; Naruse, Hiroshi; Chen, Robert I.

Book ID: 120460303
Publisher: SPIE
Year: 2002
Weight: 487 KB
Volume: 4920
Category: Article
DOI: 10.1117/12.481984

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