SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Design and Testing - Critical view of three lens design methods: damped least squares, Spencer's and Glatzel's

✍ Scribed by Rayces, Juan L.; Rosete-Aguilar, Martha; Weng, Zhicheng; Sasian, Jose M.; Wang, Yongtian

• Book ID: 115483640
• Publisher: SPIE
• Year: 2002
• Weight: 574 KB
• Volume: 4927
• Category: Article
• DOI: 10.1117/12.472494