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SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIV - Measuring the internal luminescence quantum efficiency of OLED emitter materials in electrical operation

✍ Scribed by Flämmich, Michael; Danz, Norbert; Michaelis, Dirk; Wächter, Christoph A.; Bräuer, Andreas H.; Gather, Malte C.; Meerholz, Klaus; Streubel, Klaus P.; Jeon, Heonsu; Tu, Li-Wei; Linder, Norbert

Book ID: 120278227
Publisher: SPIE
Year: 2010
Weight: 410 KB
Volume: 7617
Category: Article
DOI: 10.1117/12.842114

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