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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Interferometry XIII: Applications - Simultaneous measurement of deformation and thickness variation in polymer films

✍ Scribed by Morel, Eneas N.; Torga, Jorge R.; Novak, Erik L.; Osten, Wolfgang; Gorecki, Christophe

No coin nor oath required. For personal study only.

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