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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems VIII - ZnSe(Te)-based crystals and detectors for nondestructive testing and cargo inspection

✍ Scribed by Seminozhenko, V. P.; Ryzhikov, V. D.; Opolonin, A. D.; Lisetska, O. K.; Galkin, S. N.; Voronkin, E. F.; Kostyukevich, S. A.; Franks, Larry A.; Burger, Arnold; James, Ralph B.; Barber, H. Bradford; Doty, F. Patrick; Roehrig, Hans

Book ID: 120735649
Publisher: SPIE
Year: 2006
Weight: 323 KB
Volume: 6319
Category: Article
DOI: 10.1117/12.679498

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