✦ LIBER ✦

SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Physics and Applications of Optoelectronic Devices - Internal efficiency analysis of 280-nm light emitting diodes

✍ Scribed by Piprek, Joachim; Moe, Craig G.; Keller, Sarah L.; Nakamura, Shuji; DenBaars, Steven P.; Piprek, Joachim

No coin nor oath required. For personal study only.

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