SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Advances in Optical Thin Films - Determination of refractive index profile of ZrO2 on amorphous and pre-evaporated substrates by reverse engineering

✍ Scribed by Janicki, Vesna; Zorc, Hrvoje; Amra, Claude; Kaiser, Norbert; Macleod, H. Angus

• Book ID: 120356313
• Publisher: SPIE
• Year: 2004
• Weight: 112 KB
• Volume: 5250
• Category: Article
• DOI: 10.1117/12.512384