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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Advances in Optical Thin Films - Correlation between laser-induced-damage and nanosized absorbing defects

✍ Scribed by Bertussi, Bertrand; Natoli, Jean-Yves; During, Annelise; Commandre, Mireille; Gallais, Laurent; Rullier, Jean Luc; Bercegol, Herve; Bouchut, Philippe; Amra, Claude; Kaiser, Norbert; Macleod, H. Angus

Book ID: 118147319
Publisher: SPIE
Year: 2004
Weight: 170 KB
Volume: 5250
Category: Article
DOI: 10.1117/12.513373

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