✦ LIBER ✦
SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - X-ray reflectivity and mechanical stress in W/Si multilayers deposited on thin substrates of glass, epoxy-replicated aluminum foil, and Si wafer
✍ Scribed by Platonov, Yuriy Y.; Broadway, David M.; DeGroot, Brian; Mao, Peter H.; Harrison, Fiona A.; Gutman, George; Rodriguez, James; Hoover, Richard B.; Walker II, Arthur B. C.
- Book ID
- 111939539
- Publisher
- SPIE
- Year
- 1997
- Weight
- 409 KB
- Volume
- 3113
- Category
- Article
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