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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Applications - Application of digital speckle pattern interferometry in measurement of large deformation

✍ Scribed by Kumar, Rajesh; Rathi, Vikas; Mirza, Saba; Shakher, Chandra; Osten, Wolfgang; Novak, Erik

No coin nor oath required. For personal study only.

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