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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Infrared Systems and Photoelectronic Technology - Noise performance comparison of ICCD with CCD and EMCCD cameras

✍ Scribed by Dussault, David; Hoess, Paul; Dereniak, Eustace L.; Sampson, Robert E.; Johnson, C. Bruce

No coin nor oath required. For personal study only.

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