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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] X-Ray Sources and Optics - High spectral resolution Al2O3/B4C, SiC/Si, SiC/B4C, and SiC/C multilayer structures for the photon energies of 6 keV to 19 keV

✍ Scribed by Platonov, Yuriy Y.; Martynov, Vladimir V.; Kazimirov, Alexander; Lai, Barry; MacDonald, Carolyn A.; Macrander, Albert T.; Ishikawa, Tetsuya; Morawe, Christian; Wood, James L.


Book ID
118137588
Publisher
SPIE
Year
2004
Weight
635 KB
Volume
5537
Category
Article

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