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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Optical Diagnostic Methods for Inorganic Materials III - Recent progress at NPL in the development of mid-infrared spectrometric measurements

✍ Scribed by Clarke, Frank J. J.; Chunnilall, Christopher J.; Rogers, Leon J.; Hanssen, Leonard M.

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