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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Optical characterization in wide spectral range by a coherent spectrophotometer

โœ Scribed by Sirutkaitis, Valdas; Eckardt, Robert C.; Balachninaite, Ona; Grigonis, Rimantas; Melninkaitis, A.; Rakickas, T.; Duparre, Angela; Singh, Bhanwar


Book ID
118269108
Publisher
SPIE
Year
2003
Weight
315 KB
Volume
5188
Category
Article

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