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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Penetrating Radiation Systems and Applications VIII - Image quality analysis of a color LCD as well as a monochrome LCD using a Foveon color CMOS camera

✍ Scribed by Dallas, William J.; Roehrig, Hans; Krupinski, Elizabeth A.; Doty, F. Patrick; Barber, H. Bradford; Roehrig, Hans

No coin nor oath required. For personal study only.

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