SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Two- and Three-Dimensional Methods for Inspection and Metrology VI - 3-D shape measurement by use of a modified Fourier transform method

✍ Scribed by Guo, Hong; Huang, Peisen S.; Huang, Peisen S.; Yoshizawa, Toru; Harding, Kevin G.

• Book ID: 120578076
• Publisher: SPIE
• Year: 2008
• Weight: 467 KB
• Volume: 7066
• Category: Article
• DOI: 10.1117/12.798170