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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Remote Sensing and Modeling of Ecosystems for Sustainability V - Analysis of ecological vulnerability based on landscape pattern and ecological sensitivity: a case of Duerbete County

✍ Scribed by Jiang, Miao; Gao, Wei; Chen, Xiuwan; Zhang, Xianfeng; Wei, Wenxia; Gao, Wei; Wang, Hao

No coin nor oath required. For personal study only.

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