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SPIE Proceedings [SPIE OE/LASE '94 - Los Angeles, CA (Sunday 23 January 1994)] Diamond-Film Semiconductors - Current-voltage and capacitance-voltage characterization of MS, MiS, and MOS structures on semiconducting diamond

✍ Scribed by Hartsell, Michelle L.; Wynands, Henry A.; Fox, Bradley A.; Tamor, Mike A.; Aslam, Mohammad


Book ID
118258342
Publisher
SPIE
Year
1994
Weight
241 KB
Volume
2151
Category
Article

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