SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, CA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - Infrared reflectivity spectroscopy of optical phonons in short-period AlGaN/GaN superlattices

✍ Scribed by Herzog, J. B.; Mintairov, A. M.; Sun, K.; Cao, Y.; Jena, D.; Merz, J. L.; Postek, Michael T.; Allgair, John A.

• Book ID: 121322395
• Publisher: SPIE
• Year: 2007
• Weight: 332 KB
• Volume: 6648
• Category: Article
• DOI: 10.1117/12.738671