✦ LIBER ✦
SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, CA (Sunday 10 August 2008)] Instrumentation, Metrology, and Standards for Nanomanufacturing II - Improved performance of an ultrastable measurement platform using a field-programmable gate array for real-time deterministic control
✍ Scribed by Churnside, Allison B.; King, Gavin M.; Carter, Ashley R.; Perkins, Thomas T.; Postek, Michael T.; Allgair, John A.
- Book ID
- 120833301
- Publisher
- SPIE
- Year
- 2008
- Weight
- 339 KB
- Volume
- 7042
- Category
- Article
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