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SPIE Proceedings [SPIE Microtechnologies for the New Millennium 2005 - Sevilla, Spain (Monday 9 May 2005)] VLSI Circuits and Systems II - Digital test of a ΣΔ modulator in a mixed-signal BIST architecture

✍ Scribed by Rolindez, Luis; Mir, Salvador; Prenat, Guillaume; Lopez, Jose F.; Fernandez, Francisco V.; Lopez-Villegas, Jose Maria; de la Rosa, Jose M.

Book ID: 120074070
Publisher: SPIE
Year: 2005
Weight: 545 KB
Volume: 5837
Category: Article
DOI: 10.1117/12.607615

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