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SPIE Proceedings [SPIE Microelectronics, MEMS, and Nanotechnology - Perth, Australia (Tuesday 9 December 2003)] Device and Process Technologies for MEMS, Microelectronics, and Photonics III - How to prevent a runaway chemical reaction in the isotropic etching of silicon with HF/HNO3/CH3COOH or HNA solution

✍ Scribed by Hui, Wing C.; Chiao, Jung-Chih; Hariz, Alex J.; Jamieson, David N.; Parish, Giacinta; Varadan, Vijay K.


Book ID
120442054
Publisher
SPIE
Year
2004
Weight
399 KB
Volume
5276
Category
Article

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