✦ LIBER ✦
SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III - Optical field effect transistor with an indium tin oxide gate electrode
✍ Scribed by Fodje, J. B.; Mukherjee, D.; Hogarth, Cyril A.; DeBusk, Damon K.; Chen, Ray T.
- Book ID
- 115512433
- Publisher
- SPIE
- Year
- 1996
- Weight
- 172 KB
- Volume
- 2877
- Category
- Article
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