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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 28 September 1998)] Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Charge impurity states of In, Ga, Ge in narrow-gap PbTe

✍ Scribed by Zlomanov, Vladimir P.; Tkalich, Alexander K.; Sizov, Fiodor F.

Book ID: 118170072
Publisher: SPIE
Year: 1999
Weight: 493 KB
Volume: 3890
Category: Article
DOI: 10.1117/12.368348

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