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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Precise interferometric measurements at single-crystal silicon yielding thermal expansion coefficients from 12° to 28°C and compressibility

✍ Scribed by Schoedel, Rene; Boensch, Gerhard; Decker, Jennifer E.; Brown, Nicholas


Book ID
121237834
Publisher
SPIE
Year
2001
Weight
271 KB
Volume
4401
Category
Article

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