SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Sensors, Sensor Systems, and Sensor Data Processing - High-speed multichannel length measurement with a CCD scanning line

✍ Scribed by Huhnke, Burkhard; Loffeld, Otmar

• Book ID: 120383130
• Publisher: SPIE
• Year: 1997
• Weight: 690 KB
• Volume: 3100
• Category: Article
• DOI: 10.1117/12.287749