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SPIE Proceedings [SPIE Lasers and Materials in Industry and Opto-Contact Workshop - Quebec, Canada (Monday 13 July 1998)] Advances in Optical Beam Characterization and Measurements - Optical characterization of linear and nonlinear materials using Bessel beams

โœ Scribed by Belanger, Brigitte; Fortin, Pierre-Yves; Tovmasyan, Narine; Piche, Michel; Piche, Michel


Book ID
120711686
Publisher
SPIE
Year
1998
Weight
952 KB
Volume
3418
Category
Article

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