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SPIE Proceedings [SPIE Lasers and Materials in Industry and Opto-Contact Workshop - Quebec, Canada (Monday 13 July 1998)] Advances in Optical Beam Characterization and Measurements - Optical characterization of linear and nonlinear materials using Bessel beams

✍ Scribed by Belanger, Brigitte; Fortin, Pierre-Yves; Tovmasyan, Narine; Piche, Michel; Piche, Michel

Book ID: 120711686
Publisher: SPIE
Year: 1998
Weight: 952 KB
Volume: 3418
Category: Article
DOI: 10.1117/12.326640

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