SPIE Proceedings [SPIE LASE - San Francisco, California (Saturday 23 January 2010)] High-Power Diode Laser Technology and Applications VIII - Reliability and performance of 808-nm single emitter multi-mode laser diodes

✍ Scribed by Wang, J.; Bao, L.; Devito, M.; Xu, D.; Wise, D.; Grimshaw, M.; Dong, W.; Zhang, S.; Bai, C.; Leisher, P.; Li, D.; Zhou, H.; Patterson, S.; Martinsen, R.; Haden, J.; Zediker, Mark S.

• Book ID: 121430650
• Publisher: SPIE
• Year: 2010
• Weight: 321 KB
• Volume: 7583
• Category: Article
• DOI: 10.1117/12.842876