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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Three-Dimensional Microscopy: Image Acquisition and Processing II - Sevenfold improvement of axial resolution in 3D wide-field microscopy using two objective lenses

✍ Scribed by Gustafsson, Mats G. L.; Agard, David A.; Sedat, John W.; Wilson, Tony; Cogswell, Carol J.


Book ID
120944377
Publisher
SPIE
Year
1995
Weight
898 KB
Volume
2412
Category
Article

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