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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Document Recognition and Retrieval XX - Combining multiple thresholding binarization values to improve OCR output

✍ Scribed by Lund, William B.; Kennard, Douglas J.; Ringger, Eric K.; Zanibbi, Richard; Coüasnon, Bertrand

No coin nor oath required. For personal study only.

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