SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Photodiode dopant structure with atomically flat Si surface for high-sensitivity and stability to UV light

✍ Scribed by Nakazawa, Taiki; Kuroda, Rihito; Koda, Yasumasa; Sugawa, Shigetoshi; Widenhorn, Ralf; Nguyen, Valérie; Dupret, Antoine

• Book ID: 120059712
• Publisher: SPIE
• Year: 2012
• Weight: 620 KB
• Volume: 8298
• Category: Article
• DOI: 10.1117/12.907727