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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications - X-ray diffraction analysis of high quality InAs/GaSb Type II superlattices grown by MBE

✍ Scribed by Zhou, Yi; Chen, Jianxin; Xu, Qingqing; He, Li

Book ID: 121492592
Publisher: SPIE
Year: 2011
Weight: 404 KB
Volume: 8193
Category: Article
DOI: 10.1117/12.900328

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