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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications - Optical properties of semiconductor nanostructures under intense terahertz radiation

โœ Scribed by Zhang, Tong-Yi; Zhao, Wei; Zhang, X.-C.; Ryan, James M.; Zhang, Cun-lin; Tang, Chuan-xiang

Book ID
120368425
Publisher
SPIE
Year
2009
Weight
983 KB
Volume
7385
Category
Article

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