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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics II - Evaluation of NH4F/H2O2 effectiveness as a surface passivation agent for Cd1-xZnxTe crystals

✍ Scribed by Wright, Gomez W.; James, Ralph B.; Chinn, Douglas; Brunett, Bruce A.; Olsen, Richard W.; Van Scyoc III, John M.; Clift, W. Miles; Burger, Arnold; Chattopadhyay, Kaushik; Shi, Detang T.; Wingfield, Robert C.; James, Ralph B.; Schirato, Richard C.

Book ID: 121000605
Publisher: SPIE
Year: 2000
Weight: 968 KB
Volume: 4141
Category: Article
DOI: 10.1117/12.407594

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