✦ LIBER ✦

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components - Application of Shack-Hartmann wavefront sensing technology to transmissive optic metrology

✍ Scribed by Rammage, Ron R.; Neal, Daniel R.; Copland, Richard J.; Duparr, Angela; Singh, Bhanwar

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SPIE Proceedings [SPIE International Sym

✍ Rinder, Thomas; Rothe, Hendrik; Duparr, Angela; Singh, Bhanwar 📂 Article 📅 2002 🏛 SPIE ⚖ 514 KB

SPIE Proceedings [SPIE International Sym

✍ Zheludev, Nikolay I.; Fedotov, V. A.; MacDonald, K. F.; Stevens, G. C.; Pochon, 📂 Article 📅 2002 🏛 SPIE ⚖ 191 KB

SPIE Proceedings [SPIE International Sym

✍ Lennstrom, Kirk; Limmer, Steven J.; Cao, Guozhong; Cao, Guozhong; Kirk, Wiley P. 📂 Article 📅 2002 🏛 SPIE ⚖ 788 KB

SPIE Proceedings [SPIE International Sym

✍ Dahlin, Michael J.; O'Rourke, Edward J.; Andresen, Bjorn; Fulop, Gabor F.; Stroj 📂 Article 📅 2003 🏛 SPIE ⚖ 678 KB

SPIE Proceedings [SPIE International Sym

✍ Kik, Pieter G.; Martin, Andrea L.; Maier, Stefan A.; Atwater, Harry A.; Halas, N 📂 Article 📅 2002 🏛 SPIE ⚖ 339 KB

SPIE Proceedings [SPIE International Sym

✍ Shinman, Arit; Lipkin, Nuphar N.; Kirshner, Roy; Zipin, Hedva; Andresen, Bjorn; 📂 Article 📅 2003 🏛 SPIE ⚖ 674 KB