SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Diagnostic Methods for Inorganic Materials II - Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry

✍ Scribed by Tiwald, Thomas E.; Schubert, Mathias; Hanssen, Leonard M.

• Book ID: 120399406
• Publisher: SPIE
• Year: 2000
• Weight: 424 KB
• Volume: 4103
• Category: Article
• DOI: 10.1117/12.403587