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SPIE Proceedings [SPIE International Optical Design Conference 2010 - Jackson Hole, WY (Sunday 13 June 2010)] International Optical Design Conference 2010 - Meaningful surface roughness and quality tolerances

✍ Scribed by Aikens, David M.; Bentley, Julie; Gupta, Anurag; Youngworth, Richard N.

No coin nor oath required. For personal study only.

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