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SPIE Proceedings [SPIE International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Singapore, Singapore (Tuesday 9 April 2013)] International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013) - Application of digital image correlation for long-distance bridge deflection measurement

✍ Scribed by Tian, Long; Quan, Chenggen; Qian, Kemao; Pan, Bing; Cai, Youfa; Asundi, Anand; Liang, Hui; Zhao, Yan

Book ID: 120823488
Publisher: SPIE
Year: 2013
Weight: 358 KB
Volume: 8769
Category: Article
DOI: 10.1117/12.2020139

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