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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - A technique for extracting and analyzing the polarization aberration of hyper-numerical aperture image optics

✍ Scribed by Wang, Yongtian; Yuan, Xiaocong; Sheng, Yunlong; Tatsuno, Kimio; Li, Yanqiu; Guo, Xuejia; Liu, Xiaolin; Liu, Lihui

Book ID: 121455497
Publisher: SPIE
Year: 2013
Weight: 943 KB
Volume: 9042
Category: Article
DOI: 10.1117/12.2038176

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