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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Image denoising based on wavelet cone of influence analysis

✍ Scribed by Pang, Wei; Li, Yufeng; Yoshizawa, Toru; Wei, Ping; Zheng, Jesse

Book ID: 120195303
Publisher: SPIE
Year: 2009
Weight: 535 KB
Volume: 7513
Category: Article
DOI: 10.1117/12.838266

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