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SPIE Proceedings [SPIE International Conference on Micro-and Nano-Electronics 2012 - Zvenlgorod, Russian Federation (Monday 1 October 2012)] International Conference Micro- and Nano-Electronics 2012 - TCAD analysis of self-heating effects in bulk silicon and SOI n-MOSFETs

✍ Scribed by Petrosyants, Konstantin O.; Orekhov, Evgeny; Kharitonov, Igor; Popov, Dmitri A.; Orlikovsky, Alexander A.

Book ID: 120033835
Publisher: SPIE
Year: 2013
Weight: 754 KB
Volume: 8700
Category: Article
DOI: 10.1117/12.2017550

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