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SPIE Proceedings [SPIE International Conference on Micro- and Nano-Electronics 2009 - Zvenigorod, Russian Federation (Monday 5 October 2009)] International Conference on Micro- and Nano-Electronics 2009 - Intrinsic compact MOSFET model with correct account of positive differential conductance after saturation

✍ Scribed by Turin, Valentin O.; Sedov, Alexander V.; Zebrev, Gennady I.; Iñiguez, Benjamin; Shur, Michael S.; Valiev, Kamil A.; Orlikovsky, Alexander A.


Book ID
120293251
Publisher
SPIE
Year
2009
Weight
725 KB
Volume
7521
Category
Article

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