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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2007 - San Jose, CA (Saturday 20 January 2007)] Zinc Oxide Materials and Devices II - Vacancy defect distributions in bulk ZnO crystals

✍ Scribed by Tuomisto, Filip; Look, David C.; Hosseini Teherani, Ferechteh; Litton, Cole W.

No coin nor oath required. For personal study only.

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