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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2006 - San Jose, CA (Saturday 21 January 2006)] Photonic Crystal Materials and Devices IV - Analytical analysis of defect lines in two-dimensional photonic crystals based on polynomial expansion of electromagnetic fields

✍ Scribed by Mehrany, Khashayar; Khorasani, Sina; Chamanzar, Maysamreza; Atabaki, Amir Hossein; Rashidian, Bizhan; Adibi, Ali; Lin, Shawn-Yu; Scherer, Axel

Book ID: 120200238
Publisher: SPIE
Year: 2006
Weight: 315 KB
Volume: 6128
Category: Article
DOI: 10.1117/12.645932

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