✦ LIBER ✦

SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - A novel digital shearography with wide angle of view for nondestructive inspection

✍ Scribed by Wu, Sijin; Yang, Lianxiang; Xin, Jiezhi; Zhu, Lianqing; Wang, Zhongyu

No coin nor oath required. For personal study only.

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