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SPIE Proceedings [SPIE Fourth International Conference on Machine Vision (ICMV 11) - Singapore, Singapore (Friday 9 December 2011)] Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis - Modeling and optimizing electrodischarge machine process (EDM) with an approach based on genetic algorithm

โœ Scribed by Zabbah, Iman; Zeng, Zhu; Li, Yuting


Book ID
118130996
Publisher
SPIE
Year
2012
Weight
293 KB
Volume
8349
Category
Article

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