SPIE Proceedings [SPIE Electronic Imaging Device Engineering - Munich, Federal Republic of Germany (Monday 21 June 1993)] Computer Vision for Industry - Performance analysis of CCD cameras for industrial inspection

✍ Scribed by Beyer, Horst A.; Braggins, Donald W.

• Book ID: 111874402
• Publisher: SPIE
• Year: 1993
• Weight: 885 KB
• Volume: 1989
• Category: Article
• DOI: 10.1117/12.164888