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SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Sensors, Cameras, and Systems for Industrial/Scientific Applications IX - Noise calculation model and analysis of high-gain readout circuits for CMOS image sensors

โœ Scribed by Kawahito, Shoji; Itoh, Shinya; Blouke, Morley M.; Bodegom, Erik


Book ID
120509019
Publisher
SPIE
Year
2008
Weight
391 KB
Volume
6816
Category
Article

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