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SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Quality and System Performance V - Printer resolution measurement based on slanted edge method

✍ Scribed by Bang, Yousun; Kim, Sang Ho; Choi, Don Chul; Farnand, Susan P.; Gaykema, Frans

No coin nor oath required. For personal study only.

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